Displaying report 1-1 of 1.
Reports until 11:38, Thursday 18 June 2015
H1 General
jeffrey.bartlett@LIGO.ORG - posted 11:38, Thursday 18 June 2015 (19218)
CC Sampling from HAM6

Removed 4" wafer from HAM6, (T1500311).

Took PET swipe from south side of chamber from base of OMC to edge of the ISI table.

Both samples have been prepared for processing at CIT.

Note: The placement of the 4" wafer was in a difficult spot to remove. One had to lean into the chamber on an off balance stance and remove the wafer from the center of a group of small optics. There were no good handholds or bracing points available. The wafer being placed flat on the ISI table had to be pushed across the table until it came up against a cable clamp before one could get the tweezers under it. There was a risk of bumping or disturbing the optics around the disk. See attached photo. 

Dust counts taken during work, inside and outside the chamber were all zero or in the low 10s of counts.

Images attached to this report
Non-image files attached to this report
Displaying report 1-1 of 1.