Results/plots for the OPLEV charge measurements for the ETMX and ETMX are attached below. At the ETMX the effective bias for all four quadrants is between 0-20V for the pitch and around 20-30V for the Yaw. At the ETMY it is around 10-20 V, except for the Yaw which is inching towards 40V.

All the values were restored to its original after the measurements were completed. However, for optic align slider values, SDF differences (screenshot attached) are flagged up (for both ETMX and ETMY) which I am not sure why and this hasn't happened before. Having a look at the ndscope and going back in time, I see no difference in my restored values and the ones during the IFO lock.