The OPLEV charge measurements were truncated today after the EX and EY tripped. We managed to take only 3 measurements for both EX/EY, attached below are the results.

   ETMX: The effective bias is within the permissible limits, however for the 3rd quadrant (for both pitch and yaw) the standard deviation looks to be huge.    

ETMY: once again the long term trend of the effective bias looks ok, i.e. within 30V.  

Since charge measurements were aborted midway, this lead to a few SDF difference (screenshot attached). The Lock_bias_offset for the ETMX was showing to be +4.00 instead of -9.30. I used ndscope to look for the default values during IFO Lock (pic attached). This turned out to be -9.30 V. Similarly, for the ETMY, it wa showing up as -9.0V and the default value is zero.   

I made the necessary changes to remove the SDF.